Hitachi High-Tech Launches the Easy-to-Use AFM100 and AFM100 Plus Atomic Force Microscopes
TOKYO, Jun 17, 2021 - (JCN Newswire via SEAPRWire.com) - Hitachi High-Tech Corporation announced the launch of both AFM100 and AFM100 Plus systems - entry-level and intermediate-level models of Hitachi's compact and versatile Atomic Force Microscopes (AFM). These tools are designed to offer ease of use and superior reliability for high-throughput R&D or quality control applications.AFM100 PlusThe AFM is a type of the Scanning Probe Microscope (SPM) that scan the surface of a sample using a sharp tip typically with a radius of a few nanometers (1 nanometer = 1/1,000,000 millimeter). The AFM can provide both high-resolution visualization of surface morphology and simultaneous mapping of various other physical properties at the nanoscale. Therefore, the AFM is intensively used for scientific research and development, as well as quality control across a wide range of industrial fields, such as examining battery materials, semiconductors, polymers, living organisms, etc.Conventional AFM operation could be quite time consuming and demanding. The workflow contains some mandatory steps such as loading a tiny cantilever (approximately 1 mm wide) manually with a tweezer to the target loc...
