TOKYO, Jun 28, 2022 - (JCN Newswire via SEAPRWire.com) - Hitachi High-Tech Corporation today announced the launch of the AFM100 Pro High-Sensitivity Scanning Probe Microscope System, a high-end scanning probe microscope (AFM(1)/SPM(2)) equipped with a newly developed high-sensitivity optical head that improves sensitivity when measuring physical properties and enables measurement at atomic and molecular scales.High-Sensitivity Scanning Probe Microscope System AFM100 ProIn the field of research and development of advanced functional materials, the development of highly sensitive measurement and analysis equipment is in great demand. The AFM100 Pro meets the requirement for on-site analysis and will contribute to solving customer issues.Overview of AFMAFM is a type of measurement and analysis device that scans the surface of a sample using a probe with a tip that is just a few nanometers(3) in diameter. AFM can visualize a sample surface at the nanoscale, and simultaneously performing physical property evaluations. AFM is used in research and development and quality control across a wide range of industries, such as semiconductor, polymer, and biomedical. Hitachi High-Tech provides a...